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prSRPS EN IEC 60747-14-16:2026

Semiconductor devices - Part 14-16: Semiconductor sensors - Performance test method for capacitive fingerprint sensors

General information

10.99     Aug 31, 2026

ISS

N022

European Norm

31.080.99  

English  

Life cycle

NOW

PROJECT
prSRPS EN IEC 60747-14-16:2026
10.99 New project approved
Aug 31, 2026

Related project

Adopted from prEN IEC 60747-14-16 IDENTICAL

Adopted from IEC 60747-14-16 ED1 IDENTICAL