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SRPS EN 61000-4-20:2008

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Jun 19, 2008
95.99   Withdrawal of Standard   Oct 26, 2012

General information

95.99     Oct 26, 2012

ISS

N210

European Norm

33.100.10     33.100.20  

English  

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Scope

Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe · TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations (EUT = equipment under test); · TEM waveguide validation methods for EMC measurements; · the EUT (i.e. EUT cabinet and cabling) definition; · test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and · test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.

Related directives

NOTE: If the word "harmonized" (marked in green) is not found in the field with the name of the directive, it means that the European standard is not cited in the OJEU.

2004/108/EC

Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC

Life cycle

NOW

WITHDRAWN
SRPS EN 61000-4-20:2008
95.99 Withdrawal of Standard
Oct 26, 2012

REVISED BY

PUBLISHED
SRPS EN 61000-4-20:2012

Related project

Adopted from EN 61000-4-20:2003/A1:2007

Adopted from EN 61000-4-20:2003

National regulations and standards

"Сл. гласник РС" бр. 41/2019 41/2019
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