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SRPS EN 60749-39:2008

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Jun 19, 2008
95.99   Withdrawal of Standard   Jan 30, 2026

General information

95.99     Jan 30, 2026

ISS

N022

European Norm

31.080.01  

English  

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Scope

Detailed the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two material properties are important parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-39:2008
95.99 Withdrawal of Standard
Jan 30, 2026

REVISED BY

PUBLISHED
SRPS EN IEC 60749-39:2022

Related project

Adopted from EN 60749-39:2006