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SRPS EN 60749-26:2008

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Sep 9, 2008
95.99   Withdrawal of Standard   Oct 30, 2017

General information

95.99     Oct 30, 2017

ISS

N022

European Norm

31.080.01  

English  

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Scope

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-26:2008
95.99 Withdrawal of Standard
Oct 30, 2017

REVISED BY

WITHDRAWN
SRPS EN 60749-26:2014

Related project

Adopted from EN 60749-26:2006