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SRPS EN 60749-33:2008

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

Sep 9, 2008

General information

60.60     Sep 9, 2008

ISS

N022

European Norm

31.080  

English  

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Scope

The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.

Life cycle

NOW

PUBLISHED
SRPS EN 60749-33:2008
60.60 Standard published
Sep 9, 2008

Related project

Adopted from EN 60749-33:2004