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SRPS EN 60749-23:2008

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Sep 9, 2008

General information

60.60     Sep 9, 2008

ISS

N022

European Norm

31.080.01  

English  

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Scope

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

Life cycle

NOW

PUBLISHED
SRPS EN 60749-23:2008
60.60 Standard published
Sep 9, 2008

REVISED BY

PROJECT
dnaSRPS EN IEC 60749-23:2025

Related project

Adopted from EN 60749-23:2004