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SRPS EN 60749-31:2008

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

Oct 9, 2008

General information

60.60     Oct 9, 2008

ISS

N022

European Norm

31.080.01  

English  

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

Life cycle

NOW

PUBLISHED
SRPS EN 60749-31:2008
60.60 Standard published
Oct 9, 2008

Related project

Adopted from EN 60749-31:2003