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SRPS EN 60749-32:2008

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

Oct 9, 2008

General information

90.93     Dec 15, 2025

90.00    Dec 15, 2030

ISS

N022

European Norm

31.080.01  

English  

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.

Life cycle

NOW

PUBLISHED
SRPS EN 60749-32:2008
90.93 Standard confirmed
Dec 15, 2025

Related project

Adopted from EN 60749-32:2003