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SRPS EN 60749-8:2008

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Oct 9, 2008

General information

60.60     Oct 9, 2008

ISS

N022

European Norm

31.080.01  

English  

Buying

Published

Language in which you want to receive the document.

Scope

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

Life cycle

NOW

PUBLISHED
SRPS EN 60749-8:2008
60.60 Standard published
Oct 9, 2008

Related project

Adopted from EN 60749-8:2003