Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

SRPS EN 60749-20:2008

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat

Oct 9, 2008
95.99   Withdrawal of Standard   Apr 21, 2011

General information

95.99     Apr 21, 2011

ISS

N022

European Norm

31.080.01  

English  

Buying

Withdrawn

Language in which you want to receive the document.

Scope

Applies to semiconductor devices (discrete devices and integrated circuits) - and provides a means of assessing the resistance to soldering heat of plastic-encapsulated surface mount devices.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-20:2008
95.99 Withdrawal of Standard
Apr 21, 2011

REVISED BY

WITHDRAWN
SRPS EN 60749-20:2011

Related project

Adopted from EN 60749-20:2003