Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing No Trouble Found and Electrical Overstress failures due to latch-up.
WITHDRAWN
SRPS EN 60749-29:2008
95.99
Withdrawal of Standard
Aug 29, 2014
PUBLISHED
SRPS EN 60749-29:2013