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SRPS EN 60749-29:2008

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Jun 14, 2013
95.99   Withdrawal of Standard   Aug 29, 2014

General information

95.99     Aug 29, 2014

ISS

N022

European Norm

31.080  

English  

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Scope

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing No Trouble Found and Electrical Overstress failures due to latch-up.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-29:2008
95.99 Withdrawal of Standard
Aug 29, 2014

REVISED BY

PUBLISHED
SRPS EN 60749-29:2013

Related project

Adopted from EN 60749-29:2003