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SRPS EN 60749-5:2008

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Oct 9, 2008
95.99   Withdrawal of Standard   Nov 30, 2020

General information

95.99     Nov 30, 2020

ISS

N022

European Norm

31.080.01  

English  

повучен – седница 2020-11-09

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Scope

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-5:2008
95.99 Withdrawal of Standard
Nov 30, 2020

REVISED BY

PUBLISHED
SRPS EN 60749-5:2017

Related project

Adopted from EN 60749-5:2003