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SRPS EN 60749-36:2008

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Oct 9, 2008

General information

60.60     Oct 9, 2008

ISS

N022

European Norm

31.080.01  

English  

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Scope

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Life cycle

NOW

PUBLISHED
SRPS EN 60749-36:2008
60.60 Standard published
Oct 9, 2008

Related project

Adopted from EN 60749-36:2003