Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

SRPS EN 60749-16:2008

Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)

Oct 9, 2008

General information

60.60     Oct 9, 2008

ISS

N022

European Norm

31.080.01  

English  

Buying

Published

Language in which you want to receive the document.

Scope

Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).

Life cycle

NOW

PUBLISHED
SRPS EN 60749-16:2008
60.60 Standard published
Oct 9, 2008

Related project

Adopted from EN 60749-16:2003