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SRPS EN 61967-4:2008

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method

Dec 29, 2008
95.99   Withdrawal of Standard   Dec 30, 2024

General information

95.99     Dec 30, 2024

ISS

N022

European Norm

31.200  

English  

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Scope

Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.

Life cycle

NOW

WITHDRAWN
SRPS EN 61967-4:2008
95.99 Withdrawal of Standard
Dec 30, 2024

REVISED BY

PUBLISHED
SRPS EN IEC 61967-4:2022

Related project

Adopted from EN 61967-4:2002/A1:2006

Adopted from EN 61967-4:2002