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SRPS EN 61967-6:2008

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

Dec 29, 2008

General information

60.60    

ISS

N022

European Norm

31.200  

English  

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Scope

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.

Life cycle

NOW

PUBLISHED
SRPS EN 61967-6:2008
60.60 Standard published

Related project

Adopted from EN 61967-6:2002/A1:2008

Adopted from EN 61967-6:2002