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SRPS EN 60747-5-3:2008

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Dec 29, 2008
95.99   Withdrawal of Standard   Dec 29, 2023

General information

95.99     Dec 29, 2023

ISS

N022

European Norm

31.260  

English  

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Scope

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

Life cycle

NOW

WITHDRAWN
SRPS EN 60747-5-3:2008
95.99 Withdrawal of Standard
Dec 29, 2023

Related project

Adopted from EN 60747-5-3:2001/A1:2002

Adopted from EN 60747-5-3:2001