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SRPS EN 60749-4:2008

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Dec 29, 2008
95.99   Withdrawal of Standard   Nov 30, 2020

General information

95.99     Nov 30, 2020

ISS

N022

European Norm

31.080.01  

English  

повучен – седница 2020-11-09

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Scope

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-4:2008
95.99 Withdrawal of Standard
Nov 30, 2020

REVISED BY

PUBLISHED
SRPS EN 60749-4:2017

Related project

Adopted from EN 60749-4:2002