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SRPS EN 60749-7:2008

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Dec 29, 2008
95.99   Withdrawal of Standard   Aug 29, 2014

General information

95.99     Aug 29, 2014

ISS

N022

European Norm

31.080.01  

English  

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Scope

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-7:2008
95.99 Withdrawal of Standard
Aug 29, 2014

REVISED BY

PUBLISHED
SRPS EN 60749-7:2013

Related project

Adopted from EN 60749-7:2002