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SRPS EN 60749-10:2009

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

May 20, 2009
95.99   Withdrawal of Standard   Jan 30, 2026

General information

95.99     Jan 30, 2026

ISS

N022

European Norm

31.080.01  

English  

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Scope

Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-10:2009
95.99 Withdrawal of Standard
Jan 30, 2026

REVISED BY

PUBLISHED
SRPS EN IEC 60749-10:2022

Related project

Adopted from EN 60749-10:2002