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SRPS EN 60749-9:2009

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

May 20, 2009
95.99   Withdrawal of Standard   Nov 30, 2020

General information

95.99     Nov 30, 2020

ISS

N022

European Norm

31.080.01  

English  

повучен – седница 2020-11-09

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Scope

Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-9:2009
95.99 Withdrawal of Standard
Nov 30, 2020

REVISED BY

PUBLISHED
SRPS EN 60749-9:2017

Related project

Adopted from EN 60749-9:2002