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SRPS EN 60749-11:2009

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

May 20, 2009

General information

60.60     May 20, 2009

ISS

N022

European Norm

31.080.01  

English  

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Scope

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification.

Life cycle

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PUBLISHED
SRPS EN 60749-11:2009
60.60 Standard published
May 20, 2009

Related project

Adopted from EN 60749-11:2002