Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
WITHDRAWN
SRPS EN ISO 3274:2009
95.99
Withdrawal of Standard
Apr 30, 2025
PUBLISHED
SRPS EN ISO 25178-601:2025