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SRPS EN 62416:2011

Semiconductor devices - Hot carrier test on MOS transistors

Apr 21, 2011

General information

60.60     Apr 21, 2011

ISS

N022

European Norm

31.080  

English  

From plan 2011

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Scope

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Life cycle

NOW

PUBLISHED
SRPS EN 62416:2011
60.60 Standard published
Apr 21, 2011

Related project

Adopted from EN 62416:2010