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SRPS EN 60749-30:2008/A1:2013

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Jan 28, 2013
95.99   Withdrawal of Standard   Dec 29, 2023

General information

95.99     Dec 29, 2023

ISS

N022

European Norm

31.080.01  

English  

plan 2012.

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SRPS EN 60749-30:2008/A1:2013
95.99 Withdrawal of Standard
Dec 29, 2023

REVISED BY

PUBLISHED
SRPS EN IEC 60749-30:2020

Related project

Adopted from EN 60749-30:2005/A1:2011