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SRPS EN 60749-19:2008/A1:2013

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

Jan 28, 2013

General information

60.60     Jan 28, 2013

ISS

N022

European Norm

31.080.01  

English  

plan 2012.

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PUBLISHED
SRPS EN 60749-19:2008/A1:2013
60.60 Standard published
Jan 28, 2013

Related project

Adopted from EN 60749-19:2003/A1:2010