SRPS EN 60749-19:2008/A1:2013
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Jan 28, 2013
General information
60.60
Jan 28, 2013
ISS
N022
European Norm
31.080.01
English
plan 2012.
Life cycle
NOW
PUBLISHED
SRPS EN 60749-19:2008/A1:2013
60.60
Standard published
Jan 28, 2013
Related project
Adopted from
EN 60749-19:2003/A1:2010