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SRPS EN 61967-8:2013

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

Jan 28, 2013

General information

60.60     Jan 28, 2013

ISS

N022

European Norm

31.200  

English  

van plana 2012.

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Scope

IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This publication is to be read in conjunction with <a href='http://webstore.iec.ch/webstore/webstore.nsf/ArtNum_PK/28581'> IEC 61967-1:2002</a>.

Related directives

NOTE: If the word "harmonized" (marked in green) is not found in the field with the name of the directive, it means that the European standard is not cited in the OJEU.

2004/108/EC

Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC

Directive 2004/108/EC
2014/30/EU

Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)

Directive 2014/30/EU

Life cycle

NOW

PUBLISHED
SRPS EN 61967-8:2013
60.60 Standard published
Jan 28, 2013

REVISED BY

PUBLISHED
SRPS EN IEC 61967-8:2023

Related project

Adopted from EN 61967-8:2011