0 Items
My account
Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

SRPS EN 60749-42:2015

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

May 29, 2015

General information

60.60     May 29, 2015

ISS

N022

European Norm

31.080.01  

English  

Buying

Published

Language in which you want to receive the document.

Scope

IEC 60749-42:2014 provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments. This test method is used to evaluate the endurance against corrosion of the metallic interconnection of chips of semiconductor devices contained in plastic moulded and other types of packages. It is also used as a means of accelerating the leakage phenomena due to the moisture penetration through the passivation film and as a pre-conditioning for various kinds of tests.

Life cycle

NOW

PUBLISHED
SRPS EN 60749-42:2015
60.60 Standard published
May 29, 2015

Related project

Adopted from EN 60749-42:2014