SRPS EN 60749-27:2008/A1:2014
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Sep 22, 2014
General information
60.60
Sep 22, 2014
ISS
N022
European Norm
31.080.01
English
Dodatno na Plan iz 2014.
Life cycle
NOW
PUBLISHED
SRPS EN 60749-27:2008/A1:2014
60.60
Standard published
Sep 22, 2014
Related project
Adopted from
EN 60749-27:2006/A1:2012