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SRPS EN 60749-27:2008/A1:2014

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Sep 22, 2014

General information

60.60     Sep 22, 2014

ISS

N022

European Norm

31.080.01  

English  

Dodatno na Plan iz 2014.

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SRPS EN 60749-27:2008/A1:2014
60.60 Standard published
Sep 22, 2014

Related project

Adopted from EN 60749-27:2006/A1:2012