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SRPS EN 60749-43:2017

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

Dec 25, 2017
95.99   Withdrawal of Standard   Dec 30, 2024

General information

95.99     Dec 30, 2024

ISS

N022

European Norm

31.080.01  

English  

sednica 2017-12-06

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Scope

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-43:2017
95.99 Withdrawal of Standard
Dec 30, 2024

REVISED BY

PUBLISHED
SRPS EN IEC 63287-1:2022

Related project

Adopted from EN 60749-43:2017