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SRPS EN 62433-3:2017

EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

Dec 25, 2017

General information

60.60     Dec 25, 2017

ISS

N022

European Norm

31.200     33.100.10  

English  

plan 2017 sednica 2017-12-06

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Scope

<p class="PARAGRAPH">
IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE.  The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.<o:p></o:p>

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NOW

PUBLISHED
SRPS EN 62433-3:2017
60.60 Standard published
Dec 25, 2017

Related project

Adopted from EN 62433-3:2017