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delSRPS EN IEC 63150-1:2019

Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations

General information

50.98    

ISS

N022

European Norm

English  

Odustaje se zbog toga što je CLC odustao.

Life cycle

NOW

ABANDON
delSRPS EN IEC 63150-1:2019
50.98 Project deleted

Related project

Adopted from FprEN IEC 63150-1:2019