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delSRPS EN IEC 62047-35:2019

Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devices

General information

50.98    

ISS

N022

European Norm

English  

Odustaje se zbog toga što je CLC odustao.

Life cycle

NOW

ABANDON
delSRPS EN IEC 62047-35:2019
50.98 Project deleted

Related project

Adopted from FprEN IEC 62047-35:2019