Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

SRPS EN IEC 63202-1:2020

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells

Jul 31, 2020

General information

60.60     Jul 31, 2020

ISS

N082

European Norm

27.160  

English  

Buying

Published

Language in which you want to receive the document.

Scope

IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.

The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.

Life cycle

NOW

PUBLISHED
SRPS EN IEC 63202-1:2020
60.60 Standard published
Jul 31, 2020

Related project

Adopted from EN IEC 63202-1:2019

Adopted from IEC 63202-1:2019 ED1 IDENTICAL