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Uninterruptible power systems (UPS) - Part 1: Safety requirements

60.60   Standard published

N022 more

Uninterruptible power systems (UPS) - Part 2: Electromagnetic compatibility (EMC) requirements

60.60   Standard published

N022 more

Uninterruptible power systems (UPS) - Part 3: Method of specifying the performance and test requirements

60.60   Standard published

N022 more

Uninterruptible power systems (UPS) - Part 4: Environmental aspects - Requirements and reporting

90.93   Standard confirmed

N022 more

Uninterruptible power systems (UPS) - Part 5-3: DC output UPS - Performance and test requirements

60.60   Standard published

N022 more

Transformers, power supplies, reactors and similar products - EMC requirements

60.60   Standard published

N014 more

Cores made of soft magnetic materials - Measuring methods - Part 1: Generic specification

60.60   Standard published

N051 more

Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level

60.60   Standard published

N051 more

Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level

60.60   Standard published

N051 more

Cores made of soft magnetic materials - Measuring methods - Part 3: Magnetic properties at high excitation level

60.60   Standard published

N051 more

Cores made of soft magnetic materials - Measuring methods - Part 3: Magnetic properties at high excitation level

60.60   Standard published

N051 more

Cores made of soft magnetic materials - Measuring methods - Part 3: Magnetic properties at high excitation level

60.60   Standard published

N051 more

Safety of machinery - Application of protective equipment to detect the presence of persons

60.60   Standard published

N044 more

Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions

60.60   Standard published

N022 more

Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials

60.60   Standard published

N022 more

Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems

60.60   Standard published

N022 more

Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

60.60   Standard published

N022 more

Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures

60.60   Standard published

N022 more