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Uninterruptible power systems (UPS) - Part 1: Safety requirements
60.60 Standard published
Uninterruptible power systems (UPS) - Part 2: Electromagnetic compatibility (EMC) requirements
60.60 Standard published
Uninterruptible power systems (UPS) - Part 3: Method of specifying the performance and test requirements
60.60 Standard published
Uninterruptible power systems (UPS) - Part 4: Environmental aspects - Requirements and reporting
90.93 Standard confirmed
Uninterruptible power systems (UPS) - Part 5-3: DC output UPS - Performance and test requirements
60.60 Standard published
Transformers, power supplies, reactors and similar products - EMC requirements
60.60 Standard published
Cores made of soft magnetic materials - Measuring methods - Part 1: Generic specification
60.60 Standard published
Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level
60.60 Standard published
Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level
60.60 Standard published
Cores made of soft magnetic materials - Measuring methods - Part 3: Magnetic properties at high excitation level
60.60 Standard published
Cores made of soft magnetic materials - Measuring methods - Part 3: Magnetic properties at high excitation level
60.60 Standard published
Cores made of soft magnetic materials - Measuring methods - Part 3: Magnetic properties at high excitation level
60.60 Standard published
Safety of machinery - Application of protective equipment to detect the presence of persons
60.60 Standard published
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
60.60 Standard published
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
60.60 Standard published
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
60.60 Standard published
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
60.60 Standard published
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures
60.60 Standard published