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Projects

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Nuclear Power Plants - Instrumentation, control and electrical power systems - Application of simulation techniques

00.00   Proposal for new project received

TC 45/SC 45A more

Backscatter cargo/ vehicle radiographic inspection systems

10.20   New project ballot initiated

TC 45/SC 45B more

Boat-mounted mobile systems for the detection of illicit trafficking of radioactive materials

10.20   New project ballot initiated

TC 45/SC 45B more

<p>Electromagnetic compatibility (EMC) – Test method for measuring of transfer impedance Z<sub>T</sub> and screening attenuation a<sub>S</sub> or coupling attenuation a<sub>C</sub> on of connectors and assemblies up to and above 3 GHz -– Triaxial Ttube in tube method</p>

00.99   Approval to ballot proposal for new project

TC 46 more

Guidance for coupling attenuation and screening attenuation measurement of hybrid cables and assemblies - Triaxial method (IEC 62153-5-x)

00.00   Proposal for new project received

TC 46 more

IEC 62783-1-3 Ed 1.0: Twinax cables for digital communications - Part 1-3: Time-domain test methods for Twinax cables for digital communications, Propagation delay, intra-pair skew and inter-pair skew

00.00   Proposal for new project received

TC 46/SC 46C more

Specification of a TD measurement method for twin-axial cables

00.00   Proposal for new project received

TC 46/SC 46C more

Radio-frequency connectors - Part 1-8: Electrical test methods -Voltage standing wave ratio for a single connector by double connector method

00.99   Approval to ballot proposal for new project

TC 46/SC 46F more

Radio frequency connectors - Part 1-11: Standardization of magnetic property evaluation methods for non‑magnetic high‑frequency connectors

10.20   New project ballot initiated

TC 46/SC 46F more

Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 2: Test method for defects using optical microscopy

10.20   New project ballot initiated

TC 47 more

Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 3: Test method for defects using scanning electron microscopy

10.20   New project ballot initiated

TC 47 more

Integrated Circuits - Standard roadmap for chiplet ICs

00.00   Proposal for new project received

TC 47/SC 47A more

integrated circuits – Three Dimensional Integrated Circuits Part x: In-line thermal measurement of warpage

00.00   Proposal for new project received

TC 47/SC 47A more

Integrated circuits – Part X: Standardization Roadmap for Fan-Out Packages

00.00   Proposal for new project received

TC 47/SC 47A more

IEC60191-6-23 Ed.1.0 :Standardization roadmap for fan-out packages

00.99   Approval to ballot proposal for new project

TC 47/SC 47D more

Thermal standardization on semiconductor packages - Part 2-3: 3D thermal simulation models of semiconductor packages for steady-state analysis - LQFP packages

10.20   New project ballot initiated

TC 47/SC 47D more

IEC 6xxxxx-2: Required Specifications of package substrates for advanced semiconductor packaging - Part 2 Failure Analysis Methods for Current Induced Quality Test of Package Substrates

00.00   Proposal for new project received

TC 47/SC 47D more

IEC 6xxxxx-3: Required Specifications of package substrates for advanced semiconductor packaging - Part 3 Standard Substrates structure for Current Induced Quality Test of Package Substrates

00.00   Proposal for new project received

TC 47/SC 47D more