Projects
Search Serbian, European and international standards. Identify the standard organization, select the standard number or keyword, and complete the search you want. You can also add a standard drafting stage or a committee / national committee that drafted the standard
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-3: Blank detail specification - Inrush current application - Assessment level EZ
20.99
WD approved for registration as CD
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-4: Blank detail specification - Sensing application - Assessment level EZ
20.99
WD approved for registration as CD
Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
50.00
Final text received or FDIS registered for formal approval
Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors
30.20
CD study/ballot initiated
Semiconductor devices - Part 14-14: Semiconductor Sensors - Semiconductor Magnetic Current Sensors for Basic and Reinforced Insulation
20.99
WD approved for registration as CD
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
30.60
Close of voting/ comment period
Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array
30.99
CD approved for registration as DIS
Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes
50.99
FDIS or proof approved for publication
Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
30.99
CD approved for registration as DIS
Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
30.20
CD study/ballot initiated
Amendment 1 - Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
20.99
WD approved for registration as CD
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
40.60
Close of voting
Standard test procedures for semiconductor X-ray energy spectrometers
20.99
WD approved for registration as CD
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
40.60
Close of voting
Nuclear facilities - Electrical equipment important to safety - Qualification
40.60
Close of voting
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
30.20
CD study/ballot initiated
Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry
30.20
CD study/ballot initiated
Optical fibres - Part 1-47: Measurement methods and test procedures - Macrobending loss
40.60
Close of voting
