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IEC 63551-1 ED1

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-PD for LiDAR

General information

40.20     Sep 18, 2026

PRVC    Dec 11, 2026

IEC

TC 47

International Standard

31.080.99  

Buying

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Life cycle

NOW

PROJECT
IEC 63551-1 ED1
40.20 DIS ballot initiated: 12 weeks
Sep 18, 2026

National adoptions

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-PD for LiDAR

40.20   DIS ballot initiated: 12 weeks

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