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IEC 63551-1 ED1

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-PD for LiDAR

General information

30.20     Apr 10, 2026

PCC    Jun 5, 2026

IEC

TC 47

International Standard

31.080.99  

Life cycle

NOW

PROJECT
IEC 63551-1 ED1
30.20 CD study/ballot initiated
Apr 10, 2026

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