naSRPS EN IEC 63551-1:2026
Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-PD for LiDAR
General information
40.20
Sep 18, 2026
40.60
Nov 20, 2026
ISS
N022
European Norm
31.080.99
English
Buying
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Life cycle
NOW
PROJECT
naSRPS EN IEC 63551-1:2026
40.20
DIS ballot initiated: 12 weeks
Sep 18, 2026
Related project
Adopted from
prEN IEC 63551-1:2026
IDENTICAL
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