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prSRPS EN IEC 63551-1:2026

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-pd for lidar

General information

10.99     Feb 19, 2024

ISS

N022

European Norm

31.080.99  

English  

Life cycle

NOW

PROJECT
prSRPS EN IEC 63551-1:2026
10.99 New project approved
Feb 19, 2024

Related project

Adopted from prEN IEC 63551-1 IDENTICAL

Adopted from IEC 63551-1 ED1 IDENTICAL