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IEC 63608-1 ED1

Semiconductor devices - Reliability test methods for vibration energy harvesters - Part 1: Mechanical reliability under shock

General information

30.60     Mar 28, 2025

ACDV    Dec 31, 2025

IEC

TC 47

International Standard

31.080.99  

Life cycle

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PROJECT
IEC 63608-1 ED1
30.60 Close of voting/ comment period
Mar 28, 2025