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naSRPS EN IEC 63608-1:2026

Semiconductor devices - Reliability test methods for vibration energy harvesters - Part 1: Mechanical reliability under shock

General information

40.20     Apr 3, 2026

40.60    Jun 5, 2026

ISS

N022

European Norm

31.080.99  

English  

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Life cycle

NOW

PROJECT
naSRPS EN IEC 63608-1:2026
40.20 DIS ballot initiated: 12 weeks
Apr 3, 2026

Related project

Adopted from prEN IEC 63608-1:2026 IDENTICAL

Adopted from IEC 63608-1 ED1 IDENTICAL

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