naSRPS EN IEC 63608-1:2026
Semiconductor devices - Reliability test methods for vibration energy harvesters - Part 1: Mechanical reliability under shock
General information
40.20
Apr 3, 2026
40.60
Jun 5, 2026
ISS
N022
European Norm
31.080.99
English
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Life cycle
NOW
PROJECT
naSRPS EN IEC 63608-1:2026
40.20
DIS ballot initiated: 12 weeks
Apr 3, 2026
Related project
Adopted from
prEN IEC 63608-1:2026
IDENTICAL
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