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IEC 63364-2 ED1

Semiconductor devices - Semiconductor devices for IoT system - Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment

General information

30.60     Dec 26, 2025

IEC

TC 47

International Standard

31.080.99  

Life cycle

NOW

PROJECT
IEC 63364-2 ED1
30.60 Close of voting/ comment period
Dec 26, 2025