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prSRPS EN IEC 63364-2:2026

Semiconductor devices - Semiconductor devices for iot system - Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment

General information

10.99     Jul 21, 2025

ISS

N022

European Norm

31.080.99  

English  

Life cycle

NOW

PROJECT
prSRPS EN IEC 63364-2:2026
10.99 New project approved
Jul 21, 2025

Related project

Adopted from prEN IEC 63364-2 IDENTICAL

Adopted from IEC 63364-2 ED1 IDENTICAL