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IEC 63550-6 ED1

Semiconductor devices - Neuromorphic devices - Part 6:Evaluation method of basic characteristics in one transistor one memristor (1T1M) arrays

General information

30.20     Sep 4, 2026

PCC    Oct 30, 2026

IEC

TC 47

International Standard

31.080.99  

Life cycle

NOW

PROJECT
IEC 63550-6 ED1
30.20 CD study/ballot initiated
Sep 4, 2026

National adoptions

Semiconductor devices-neuromorphic devices - Part 6:evaluation method of basic characteristics in one transistor one memristor (1T1M) arrays

10.99   New project approved

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