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prSRPS EN IEC 63550-6:2026

Semiconductor devices-neuromorphic devices - Part 6:evaluation method of basic characteristics in one transistor one memristor (1T1M) arrays

General information

10.99     Mar 23, 2026

ISS

N022

European Norm

31.080.99  

English  

Life cycle

NOW

PROJECT
prSRPS EN IEC 63550-6:2026
10.99 New project approved
Mar 23, 2026

Related project

Adopted from prEN IEC 63550-6 IDENTICAL

Adopted from IEC 63550-6 ED1 IDENTICAL