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naSRPS EN IEC 60749-29:2026

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

General information

40.60     Apr 3, 2026

ISS

N022

European Norm

31.080.01  

English  

Life cycle

PREVIOUSLY

PUBLISHED
SRPS EN 60749-29:2013

NOW

PROJECT
naSRPS EN IEC 60749-29:2026
40.60 Close of voting
Apr 3, 2026

Related project

Adopted from prEN IEC 60749-29:2026 IDENTICAL

Adopted from IEC 60749-29 ED3 IDENTICAL