0 Items
My account
Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

IEC 62969-4:2018 ED1

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

Jun 18, 2018

General information

60.60     Jun 18, 2018

IEC

TC 47

International Standard

31.080.99  

English   French  

Buying

Published

Language in which you want to receive the document.

Scope

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

Life cycle

NOW

PUBLISHED
IEC 62969-4:2018 ED1
60.60 Standard published
Jun 18, 2018

National adoptions

SRPS EN IEC 62969-4:2018  
ISS

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

90.93   Standard confirmed

N022 more