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SRPS EN IEC 62969-4:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

Oct 31, 2018

General information

90.93     Dec 15, 2025

90.00    Dec 15, 2030

ISS

N022

European Norm

31.080.99  

English  

sedica 2018-09-25

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Scope

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

Life cycle

NOW

PUBLISHED
SRPS EN IEC 62969-4:2018
90.93 Standard confirmed
Dec 15, 2025

Related project

Adopted from EN IEC 62969-4:2018

Adopted from IEC 62969-4:2018 ED1 IDENTICAL