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ISO/NP 25386.2

Microbeam Analysis-Analytical Electron Microscopy-Vocabulary used in TEM grids and supporting films

General information

10.20     Oct 26, 2026

ISO

ISO/TC 202/SC 3

International Standard

Scope

This document defines the terms commonly used in the design, production, inspection, and application of transmission electron microscope grids and support films.This document is applicable to the preparation of all standardization documents related to transmission electron microscope grids and support films.

Life cycle

NOW

PROJECT
ISO/NP 25386.2
10.20 New project ballot initiated
Oct 26, 2026