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ISO/NP 25386.2

Microbeam Analysis-Analytical Electron Microscopy-Vocabulary used in TEM grids and supporting films

Опште информације

10.20     26. 10. 2026.

ISO

ISO/TC 202/SC 3

Međunarodni standard

Apstrakt

This document defines the terms commonly used in the design, production, inspection, and application of transmission electron microscope grids and support films.This document is applicable to the preparation of all standardization documents related to transmission electron microscope grids and support films.

Životni ciklus

TRENUTNO

PROJEKAT
ISO/NP 25386.2
10.20 Početak izjašnjavanja o predlogu
26. 10. 2026.